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Information from the Commission - Invitation to submit proposals to the Research and Development Programme on applied metrology and chemical analysis for coordinated activities on sub-micron and nano-metre metrology and metrology for automated manufacturing processes
Information from the Commission - Invitation to submit proposals to the Research and Development Programme on applied metrology and chemical analysis for coordinated activities on sub-micron and nano-metre metrology and metrology for automated manufacturing processes
Metapodatki publikacije
- Objavljeno:
- Korporativni avtor (-ji): Evropska komisija
- OJ : JOC_1990_031_R_0004_01
- CELEX : 31990Y0209(02)
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